Jeffrey M. Voas, Frank Charron, Keith W. Miller. Investigating rare-event failure tolerance: reductions in future uncertainty. In 1st High-Assurance Systems Engineering Workshop (HASE 96), October 22, 1996, Niagara, Canada, Proceedings. pages 78-85, IEEE Computer Society, 1996. [doi]
@inproceedings{VoasCM96,
title = {Investigating rare-event failure tolerance: reductions in future uncertainty},
author = {Jeffrey M. Voas and Frank Charron and Keith W. Miller},
year = {1996},
url = {http://computer.org/proceedings/hase/7629/76290078abs.htm},
researchr = {https://researchr.org/publication/VoasCM96},
cites = {0},
citedby = {0},
pages = {78-85},
booktitle = {1st High-Assurance Systems Engineering Workshop (HASE 96), October 22, 1996, Niagara, Canada, Proceedings},
publisher = {IEEE Computer Society},
}