Kenny Vohl, Tobias Zekorn, Erik Wehr, Ralf Wunderlich, Stefan Heinen. A 208 MS/s 32-Channel Burst-Sampling ADC in 0.18um BiCMOS. In 32nd IEEE International Conference on Electronics, Circuits and Systems, ICECS 2025, Marrakech, Morocco, November 17-19, 2025. pages 1-4, IEEE, 2025. [doi]
Abstract is missing.