Harpreet Vohra, Amardeep Singh. Optimal Selective Count Compatible Runlength Encoding for SOC Test Data Compression. J. Electronic Testing, 32(6):735-747, 2016. [doi]
@article{VohraS16,
title = {Optimal Selective Count Compatible Runlength Encoding for SOC Test Data Compression},
author = {Harpreet Vohra and Amardeep Singh},
year = {2016},
doi = {10.1007/s10836-016-5617-x},
url = {http://dx.doi.org/10.1007/s10836-016-5617-x},
researchr = {https://researchr.org/publication/VohraS16},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {32},
number = {6},
pages = {735-747},
}