Ihar Volkau, Abdul Mujeeb, Wenting Dai, Marius Erdt, Alexei Sourin. Detection Defect in Printed Circuit Boards using Unsupervised Feature Extraction Upon Transfer Learning. In 2019 International Conference on Cyberworlds, CW 2019, Kyoto, Japan, October 2-4, 2019. pages 101-108, IEEE, 2019. [doi]
@inproceedings{VolkauMDES19,
title = {Detection Defect in Printed Circuit Boards using Unsupervised Feature Extraction Upon Transfer Learning},
author = {Ihar Volkau and Abdul Mujeeb and Wenting Dai and Marius Erdt and Alexei Sourin},
year = {2019},
doi = {10.1109/CW.2019.00025},
url = {https://doi.org/10.1109/CW.2019.00025},
researchr = {https://researchr.org/publication/VolkauMDES19},
cites = {0},
citedby = {0},
pages = {101-108},
booktitle = {2019 International Conference on Cyberworlds, CW 2019, Kyoto, Japan, October 2-4, 2019},
publisher = {IEEE},
isbn = {978-1-7281-2297-7},
}