Ihar Volkau, Abdul Mujeeb, Wenting Dai, Marius Erdt, Alexei Sourin. Detection Defect in Printed Circuit Boards using Unsupervised Feature Extraction Upon Transfer Learning. In 2019 International Conference on Cyberworlds, CW 2019, Kyoto, Japan, October 2-4, 2019. pages 101-108, IEEE, 2019. [doi]
Abstract is missing.