Tackling test trade-offs from design, manufacturing to market using economic modeling - researchr publication authors

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Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff. Tackling test trade-offs from design, manufacturing to market using economic modeling. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 1098-1107, IEEE Computer Society, 2001.

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