Ramakrishna Voorakaranam, Abhijit Chatterjee. Hierarchical Test Generation for Analog Circuits Using Incremental Test Development. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 296-303, IEEE Computer Society, 1999. [doi]
@inproceedings{VoorakaranamC99,
title = {Hierarchical Test Generation for Analog Circuits Using Incremental Test Development},
author = {Ramakrishna Voorakaranam and Abhijit Chatterjee},
year = {1999},
url = {http://csdl.computer.org/comp/proceedings/vts/1999/0146/00/01460296abs.htm},
tags = {testing, incremental},
researchr = {https://researchr.org/publication/VoorakaranamC99},
cites = {0},
citedby = {0},
pages = {296-303},
booktitle = {17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-0146-X},
}