Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee. Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1174-1181, IEEE Computer Society, 2003. [doi]
Abstract is missing.