Ioannis Voyiatzis, Costas Efstathiou, Cleo Sgouropoulou. Test vector embedding in accumulators with stored carry in O(1) time. In 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Tunis, Tunisia, May 16-18, 2012. pages 1-6, IEEE, 2012. [doi]
Abstract is missing.