Ioannis Voyiatzis, Costas Efstathiou, Cleo Sgouropoulou. A low-cost input vector monitoring concurrent BIST scheme. In 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013. pages 179-180, IEEE, 2013. [doi]
Abstract is missing.