Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Constantin Halatsis. A concurrent built-in self-test architecture based on a self-testing RAM. IEEE Transactions on Reliability, 54(1):69-78, 2005. [doi]
@article{VoyiatzisPGKH05,
title = {A concurrent built-in self-test architecture based on a self-testing RAM},
author = {Ioannis Voyiatzis and Antonis M. Paschalis and Dimitris Gizopoulos and Nektarios Kranitis and Constantin Halatsis},
year = {2005},
doi = {10.1109/TR.2004.842091},
url = {http://dx.doi.org/10.1109/TR.2004.842091},
tags = {rule-based, architecture, testing},
researchr = {https://researchr.org/publication/VoyiatzisPGKH05},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {54},
number = {1},
pages = {69-78},
}