A concurrent built-in self-test architecture based on a self-testing RAM

Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Constantin Halatsis. A concurrent built-in self-test architecture based on a self-testing RAM. IEEE Transactions on Reliability, 54(1):69-78, 2005. [doi]

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