Predictive modeling of board level shock-impact reliability of the HVQFN-family

J. de Vries, W. Balemans, W. D. van Driel. Predictive modeling of board level shock-impact reliability of the HVQFN-family. Microelectronics Reliability, 50(2):228-234, 2010. [doi]

Authors

J. de Vries

This author has not been identified. Look up 'J. de Vries' in Google

W. Balemans

This author has not been identified. Look up 'W. Balemans' in Google

W. D. van Driel

This author has not been identified. Look up 'W. D. van Driel' in Google