J. de Vries, W. Balemans, W. D. van Driel. Predictive modeling of board level shock-impact reliability of the HVQFN-family. Microelectronics Reliability, 50(2):228-234, 2010. [doi]
@article{VriesBD10,
title = {Predictive modeling of board level shock-impact reliability of the HVQFN-family},
author = {J. de Vries and W. Balemans and W. D. van Driel},
year = {2010},
doi = {10.1016/j.microrel.2009.10.015},
url = {http://dx.doi.org/10.1016/j.microrel.2009.10.015},
tags = {modeling, reliability},
researchr = {https://researchr.org/publication/VriesBD10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {2},
pages = {228-234},
}