R. de Vries, Augustus J. E. M. Janssen. Decreasing the Sensitivity of ADC Test Parameters by Means of Wobbling. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 386-393, IEEE Computer Society, 1998. [doi]
@inproceedings{VriesJ98,
title = {Decreasing the Sensitivity of ADC Test Parameters by Means of Wobbling},
author = {R. de Vries and Augustus J. E. M. Janssen},
year = {1998},
url = {http://csdl2.computer.org/dl/proceedings/vts/1998/8436/00/84360386.pdf},
tags = {testing, e-science},
researchr = {https://researchr.org/publication/VriesJ98},
cites = {0},
citedby = {0},
pages = {386-393},
booktitle = {16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA},
publisher = {IEEE Computer Society},
isbn = {0-8186-8436-4},
}