Thi-Thu-Huyen Vu, Dinh-Lam Pham, Tai-Woo Chang. A YOLO-based Real-time Packaging Defect Detection System. In Francesco Longo 0002, Michael Affenzeller, Antonio Padovano, Weiming Shen 0001, editors, Proceedings of the 4th International Conference on Industry 4.0 and Smart Manufacturing (ISM 2023), Lisbon, Portugal, 22-24 November 2023. Volume 217 of Procedia Computer Science, pages 886-894, Elsevier, 2023. [doi]
Abstract is missing.