A New BIST Approach for Delay Fault Testing

Anton Vuksic, Karl Fuchs. A New BIST Approach for Delay Fault Testing. In Robert Werner, editor, EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France. pages 284-288, IEEE Computer Society, 1994.

@inproceedings{VuksicF94,
  title = {A New BIST Approach for Delay Fault Testing},
  author = {Anton Vuksic and Karl Fuchs},
  year = {1994},
  tags = {testing, systematic-approach},
  researchr = {https://researchr.org/publication/VuksicF94},
  cites = {0},
  citedby = {0},
  pages = {284-288},
  booktitle = {EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France},
  editor = {Robert Werner},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-5410-4},
}