Local pattern-based descriptors for iris recognition: A comparative analysis

Ritesh Vyas, Tirupathiraju Kanumuri, Gyanendra Sheoran, Vineeta Kumari. Local pattern-based descriptors for iris recognition: A comparative analysis. In 13th IEEE International Conference on Industrial and Information Systems, ICIIS 2018, Rupnagar, India, December 1-2, 2018. pages 36-41, IEEE, 2018. [doi]

Abstract

Abstract is missing.