Electrical properties of carbon nanotube via interconnects for 30 nm linewidth and beyond

Anshul A. Vyas, Changjian Zhou, Patrick Wilhite, Phillip Wang, Cary Y. Yang. Electrical properties of carbon nanotube via interconnects for 30 nm linewidth and beyond. Microelectronics Reliability, 61:35-42, 2016. [doi]

Abstract

Abstract is missing.