Alta de Waal, Jacobus Venter, Etienne Barnard. Applying Topic Modeling to Forensic Data. In Indrajit Ray, Sujeet Shenoi, editors, Advances in Digital Forensics IV, Fourth Annual IFIP WG 11.9 Conference on Digital Forensics, Kyoto University, Kyoto, Japan, January 28-30, 2008. Volume 285 of IFIP, pages 115-126, Springer, 2008. [doi]
Abstract is missing.