Gate Stack Resistance and Limits to CMOS Logic Performance

Richard A. Wachnik, Sungjae Lee, Li-Hong Pan, Hongmei Li, Ning Lu, Jing Wang, Christophe Bernicot, Raphael Bingert, Mai Randall, Scott K. Springer, Christopher S. Putnam. Gate Stack Resistance and Limits to CMOS Logic Performance. IEEE Trans. on Circuits and Systems, 61-I(8):2318-2325, 2014. [doi]

@article{WachnikLPLLWBBRSP14,
  title = {Gate Stack Resistance and Limits to CMOS Logic Performance},
  author = {Richard A. Wachnik and Sungjae Lee and Li-Hong Pan and Hongmei Li and Ning Lu and Jing Wang and Christophe Bernicot and Raphael Bingert and Mai Randall and Scott K. Springer and Christopher S. Putnam},
  year = {2014},
  doi = {10.1109/TCSI.2014.2321199},
  url = {http://dx.doi.org/10.1109/TCSI.2014.2321199},
  researchr = {https://researchr.org/publication/WachnikLPLLWBBRSP14},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on Circuits and Systems},
  volume = {61-I},
  number = {8},
  pages = {2318-2325},
}