Antonia Wachter-Zeh, Eitan Yaakobi. Masking trapped charge in flash memories. In 53rd Annual Allerton Conference on Communication, Control, and Computing, Allerton 2015, Allerton Park & Retreat Center, Monticello, IL, USA, September 29 - October 2, 2015. pages 696-703, IEEE, 2015. [doi]
Abstract is missing.