Convergence between rejection citations and X/Y citations across patent offices

Tetsuo Wada. Convergence between rejection citations and X/Y citations across patent offices. In Giuseppe Catalano, Cinzia Daraio, Martina Gregori, Henk F. Moed, Giancarlo Ruocco, editors, Proceedings of ISSI 2019 Rome: 17th International Society of Scientometrics and Informetrics Conference, Rome, Italy, 2-5 September, 2019, Rome, Italy, September 2-5, 2019. pages 2163-2170, Edizioni Efesto, 2019.

@inproceedings{Wada19-0,
  title = {Convergence between rejection citations and X/Y citations across patent offices},
  author = {Tetsuo Wada},
  year = {2019},
  researchr = {https://researchr.org/publication/Wada19-0},
  cites = {0},
  citedby = {0},
  pages = {2163-2170},
  booktitle = {Proceedings of ISSI 2019 Rome: 17th International Society of Scientometrics and Informetrics Conference, Rome, Italy, 2-5 September, 2019, Rome, Italy, September 2-5, 2019},
  editor = {Giuseppe Catalano and Cinzia Daraio and Martina Gregori and Henk F. Moed and Giancarlo Ruocco},
  publisher = {Edizioni Efesto},
  isbn = {978-88-3381-118-5},
}