Convergence between rejection citations and X/Y citations across patent offices

Tetsuo Wada. Convergence between rejection citations and X/Y citations across patent offices. In Giuseppe Catalano, Cinzia Daraio, Martina Gregori, Henk F. Moed, Giancarlo Ruocco, editors, Proceedings of ISSI 2019 Rome: 17th International Society of Scientometrics and Informetrics Conference, Rome, Italy, 2-5 September, 2019, Rome, Italy, September 2-5, 2019. pages 2163-2170, Edizioni Efesto, 2019.

Abstract

Abstract is missing.