Marcus Wagner, Hans-Joachim Wunderlich. Probabilistic sensitization analysis for variation-aware path delay fault test evaluation. In 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017. pages 1-6, IEEE, 2017. [doi]
@inproceedings{WagnerW17, title = {Probabilistic sensitization analysis for variation-aware path delay fault test evaluation}, author = {Marcus Wagner and Hans-Joachim Wunderlich}, year = {2017}, doi = {10.1109/ETS.2017.7968226}, url = {https://doi.org/10.1109/ETS.2017.7968226}, researchr = {https://researchr.org/publication/WagnerW17}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017}, publisher = {IEEE}, isbn = {978-1-5090-5457-2}, }