Dominik Jens Elias Waibel, Ulf Tiemann, Valerio Lupperger, Henrik Semb, Carsten Marr. In-Silico Staining from Bright-Field and Fluorescent Images Using Deep Learning. In Igor V. Tetko, Vera Kurková, Pavel Karpov, Fabian J. Theis, editors, Artificial Neural Networks and Machine Learning - ICANN 2019: Image Processing - 28th International Conference on Artificial Neural Networks, Munich, Germany, September 17-19, 2019, Proceedings, Part III. Volume 11729 of Lecture Notes in Computer Science, pages 184-186, Springer, 2019. [doi]
Abstract is missing.