Alvernon Walker. A Step Response Based Mixed-Signal BIST Approach . In 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings. pages 329-337, IEEE Computer Society, 2001. [doi]
@inproceedings{Walker01:3,
title = {A Step Response Based Mixed-Signal BIST Approach },
author = {Alvernon Walker},
year = {2001},
url = {http://computer.org/proceedings/dft/1203/12030329abs.htm},
tags = {rule-based, systematic-approach},
researchr = {https://researchr.org/publication/Walker01%3A3},
cites = {0},
citedby = {0},
pages = {329-337},
booktitle = {16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-1203-8},
}