Kenneth M. Wallquist. On the Effect of I::SSQ:: Testing in Reducing Early Failure Rate. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 910-915, IEEE Computer Society, 1995.
@inproceedings{Wallquist95:0,
title = {On the Effect of I::SSQ:: Testing in Reducing Early Failure Rate},
author = {Kenneth M. Wallquist},
year = {1995},
tags = {testing},
researchr = {https://researchr.org/publication/Wallquist95%3A0},
cites = {0},
citedby = {0},
pages = {910-915},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}