Reliability of dissimilarity measures for multi-voxel pattern analysis

Alexander Walther, Hamed Nili, Naveed Ejaz, Arjen Alink, Nikolaus Kriegeskorte, Jörn Diedrichsen. Reliability of dissimilarity measures for multi-voxel pattern analysis. NeuroImage, 137:188-200, 2016. [doi]

@article{WaltherNEAKD16,
  title = {Reliability of dissimilarity measures for multi-voxel pattern analysis},
  author = {Alexander Walther and Hamed Nili and Naveed Ejaz and Arjen Alink and Nikolaus Kriegeskorte and Jörn Diedrichsen},
  year = {2016},
  doi = {10.1016/j.neuroimage.2015.12.012},
  url = {http://dx.doi.org/10.1016/j.neuroimage.2015.12.012},
  researchr = {https://researchr.org/publication/WaltherNEAKD16},
  cites = {0},
  citedby = {0},
  journal = {NeuroImage},
  volume = {137},
  pages = {188-200},
}