Mingming Wan, Run Dong, Jingru Yang, Zixiao Xu, Bowen Zhang, Kun He, Weilin Li. Fault Mechanism and Protection Strategy for DC Micro-grid. In 28th IEEE International Symposium on Industrial Electronics, ISIE 2019, Vancouver, BC, Canada, June 12-14, 2019. pages 2597-2602, IEEE, 2019. [doi]
Abstract is missing.