Hu Wan, Youyou Lu, Yuanchao Xu, Jiwu Shu. Empirical study of redo and undo logging in persistent memory. In 5th Non-Volatile Memory Systems and Applications Symposium, NVMSA 2016, Daegu, South Korea, August 17-19, 2016. pages 1-6, IEEE, 2016. [doi]
@inproceedings{WanLXS16, title = {Empirical study of redo and undo logging in persistent memory}, author = {Hu Wan and Youyou Lu and Yuanchao Xu and Jiwu Shu}, year = {2016}, doi = {10.1109/NVMSA.2016.7547178}, url = {http://dx.doi.org/10.1109/NVMSA.2016.7547178}, researchr = {https://researchr.org/publication/WanLXS16}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {5th Non-Volatile Memory Systems and Applications Symposium, NVMSA 2016, Daegu, South Korea, August 17-19, 2016}, publisher = {IEEE}, isbn = {978-1-5090-4136-7}, }