Hu Wan, Youyou Lu, Yuanchao Xu, Jiwu Shu. Empirical study of redo and undo logging in persistent memory. In 5th Non-Volatile Memory Systems and Applications Symposium, NVMSA 2016, Daegu, South Korea, August 17-19, 2016. pages 1-6, IEEE, 2016. [doi]
Abstract is missing.