Jianbiao Wan, Kar-Peo Yar, Chunling Du, Malcolm Yoke-Hean Low. Sensor Data Analytics for Tool Condition Anomaly Detection with Machine Learning Techniques. In Proceedings of the 2023 5th International Electronics Communication Conference, IECC 2023, Osaka City, Japan, July 21-23, 2023. pages 38-45, ACM, 2023. [doi]
Abstract is missing.