Seongrnoon Wang. Low hardware overhead scan based 3-weight weighted random BIST. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 868-877, IEEE Computer Society, 2001.
@inproceedings{Wang01:5,
title = {Low hardware overhead scan based 3-weight weighted random BIST},
author = {Seongrnoon Wang},
year = {2001},
tags = {rule-based},
researchr = {https://researchr.org/publication/Wang01%3A5},
cites = {0},
citedby = {0},
pages = {868-877},
booktitle = {Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001},
publisher = {IEEE Computer Society},
isbn = {0-7803-7169-0},
}