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Detecting "0-Day" Vulnerability: An Empirical Study of Secret Security Patch in OSS

Xinda Wang, Kun Sun 0001, Archer L. Batcheller, Sushil Jajodia. Detecting "0-Day" Vulnerability: An Empirical Study of Secret Security Patch in OSS. In 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2019, Portland, OR, USA, June 24-27, 2019. pages 485-492, IEEE, 2019. [doi]

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Xinda Wang

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Kun Sun 0001

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Archer L. Batcheller

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Sushil Jajodia

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