Detecting "0-Day" Vulnerability: An Empirical Study of Secret Security Patch in OSS

Xinda Wang, Kun Sun 0001, Archer L. Batcheller, Sushil Jajodia. Detecting "0-Day" Vulnerability: An Empirical Study of Secret Security Patch in OSS. In 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2019, Portland, OR, USA, June 24-27, 2019. pages 485-492, IEEE, 2019. [doi]

@inproceedings{Wang0BJ19,
  title = {Detecting "0-Day" Vulnerability: An Empirical Study of Secret Security Patch in OSS},
  author = {Xinda Wang and Kun Sun 0001 and Archer L. Batcheller and Sushil Jajodia},
  year = {2019},
  doi = {10.1109/DSN.2019.00056},
  url = {https://doi.org/10.1109/DSN.2019.00056},
  researchr = {https://researchr.org/publication/Wang0BJ19},
  cites = {0},
  citedby = {0},
  pages = {485-492},
  booktitle = {49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2019, Portland, OR, USA, June 24-27, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-0057-9},
}