Albert Z. Wang, Fei Lu 0004, Qi Chen, Chenkun Wang, Cheng Li, Feilong Zhang. Key note: Integrated design-for-reliability for ICs. In 8th IEEE Latin American Symposium on Circuits & Systems, LASCAS 2017, Bariloche, Argentina, February 20-23, 2017. pages 1-4, IEEE, 2017. [doi]
@inproceedings{Wang0CWLZ17,
title = {Key note: Integrated design-for-reliability for ICs},
author = {Albert Z. Wang and Fei Lu 0004 and Qi Chen and Chenkun Wang and Cheng Li and Feilong Zhang},
year = {2017},
doi = {10.1109/LASCAS.2017.7948037},
url = {https://doi.org/10.1109/LASCAS.2017.7948037},
researchr = {https://researchr.org/publication/Wang0CWLZ17},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {8th IEEE Latin American Symposium on Circuits & Systems, LASCAS 2017, Bariloche, Argentina, February 20-23, 2017},
publisher = {IEEE},
isbn = {978-1-5090-5859-4},
}