Key note: Integrated design-for-reliability for ICs

Albert Z. Wang, Fei Lu 0004, Qi Chen, Chenkun Wang, Cheng Li, Feilong Zhang. Key note: Integrated design-for-reliability for ICs. In 8th IEEE Latin American Symposium on Circuits & Systems, LASCAS 2017, Bariloche, Argentina, February 20-23, 2017. pages 1-4, IEEE, 2017. [doi]

Abstract

Abstract is missing.