Yaojing Wang, Yuan Yao 0001, Hanghang Tong, Xuan Huo, Min Li, Feng Xu 0007, Jian Lu 0001. Bug Localization via Supervised Topic Modeling. In IEEE International Conference on Data Mining, ICDM 2018, Singapore, November 17-20, 2018. pages 607-616, IEEE Computer Society, 2018. [doi]
Abstract is missing.