Highlighted Deep Learning based Identification of Pharmaceutical Blister Packages

Jing-Syuan Wang, Arul-Murugan Ambikapathi, Yun Han, Sheng-Luen Chung, Hsien-Wei Ting, Chih-Fang Chen. Highlighted Deep Learning based Identification of Pharmaceutical Blister Packages. In 23rd IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2018, Torino, Italy, September 4-7, 2018. pages 638-645, IEEE, 2018. [doi]

Abstract

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