Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation

Senling Wang, Hanan T. Al-Awadhi, Soh Hamada, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Jun Matsushima. Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 209-214, IEEE Computer Society, 2016. [doi]

Authors

Senling Wang

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Hanan T. Al-Awadhi

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Soh Hamada

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Yoshinobu Higami

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Hiroshi Takahashi

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Hiroyuki Iwata

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Jun Matsushima

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