Senling Wang, Hanan T. Al-Awadhi, Soh Hamada, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Jun Matsushima. Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 209-214, IEEE Computer Society, 2016. [doi]
Abstract is missing.