Sui-Yu Wang, Henry S. Baird. Feature selection focused within error clusters. In 19th International Conference on Pattern Recognition (ICPR 2008), December 8-11, 2008, Tampa, Florida, USA. pages 1-4, IEEE, 2008. [doi]
@inproceedings{WangB08:8, title = {Feature selection focused within error clusters}, author = {Sui-Yu Wang and Henry S. Baird}, year = {2008}, doi = {10.1109/ICPR.2008.4761924}, url = {http://dx.doi.org/10.1109/ICPR.2008.4761924}, researchr = {https://researchr.org/publication/WangB08%3A8}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {19th International Conference on Pattern Recognition (ICPR 2008), December 8-11, 2008, Tampa, Florida, USA}, publisher = {IEEE}, isbn = {978-1-4244-2175-6}, }