Meta-Cure: a reliability enhancement strategy for metadata in NAND flash memory storage systems

Yi Wang 0003, Luis Angel D. Bathen, Nikil D. Dutt, Zili Shao. Meta-Cure: a reliability enhancement strategy for metadata in NAND flash memory storage systems. In Patrick Groeneveld, Donatella Sciuto, Soha Hassoun, editors, The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012. pages 214-219, ACM, 2012. [doi]

@inproceedings{WangBDS12,
  title = {Meta-Cure: a reliability enhancement strategy for metadata in NAND flash memory storage systems},
  author = {Yi Wang 0003 and Luis Angel D. Bathen and Nikil D. Dutt and Zili Shao},
  year = {2012},
  doi = {10.1145/2228360.2228401},
  url = {http://doi.acm.org/10.1145/2228360.2228401},
  researchr = {https://researchr.org/publication/WangBDS12},
  cites = {0},
  citedby = {0},
  pages = {214-219},
  booktitle = {The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012},
  editor = {Patrick Groeneveld and Donatella Sciuto and Soha Hassoun},
  publisher = {ACM},
  isbn = {978-1-4503-1199-1},
}