Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics

Zhanglei Wang, Krishnendu Chakrabarty. Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics. J. Electronic Testing, 23(2-3):145-161, 2007. [doi]

Authors

Zhanglei Wang

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Krishnendu Chakrabarty

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