Ran Wang, Krishnendu Chakrabarty. Testing of interposer-based 2.5D integrated circuits. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-10, IEEE, 2016. [doi]
@inproceedings{WangC16-49,
title = {Testing of interposer-based 2.5D integrated circuits},
author = {Ran Wang and Krishnendu Chakrabarty},
year = {2016},
doi = {10.1109/TEST.2016.7805875},
url = {http://dx.doi.org/10.1109/TEST.2016.7805875},
researchr = {https://researchr.org/publication/WangC16-49},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8773-6},
}