Testing of interposer-based 2.5D integrated circuits

Ran Wang, Krishnendu Chakrabarty. Testing of interposer-based 2.5D integrated circuits. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-10, IEEE, 2016. [doi]

Abstract

Abstract is missing.