Xu Wang, Pan Cheng. Deep Learning-Based Visual Defect Inspection System for Pouch Battery Packs. In Yujiu Yang, Xiaohui Wang, Liang-Jie Zhang, editors, Cognitive Computing - ICCC 2022 - 6th International Conference, Held as Part of the Services Conference Federation, SCF 2022, Honolulu, HI, USA, December 10-14, 2022, Proceedings. Volume 13734 of Lecture Notes in Computer Science, pages 54-64, Springer, 2022. [doi]
Abstract is missing.