Dual Entropy-Controlled Convolutional Neural Network for Mini/Micro LED Defect Recognition

Yuxiang Wang, Jie Chu, Yu Chen, Dong Liang, Kailin Wen, Jueping Cai. Dual Entropy-Controlled Convolutional Neural Network for Mini/Micro LED Defect Recognition. IEEE T. Instrumentation and Measurement, 72:1-14, 2023. [doi]

Abstract

Abstract is missing.