Deep Metric Learning with Data Summarization

Wenlin Wang, Changyou Chen, Wenlin Chen, Piyush Rai, Lawrence Carin. Deep Metric Learning with Data Summarization. In Paolo Frasconi, Niels Landwehr, Giuseppe Manco, Jilles Vreeken, editors, Machine Learning and Knowledge Discovery in Databases - European Conference, ECML PKDD 2016, Riva del Garda, Italy, September 19-23, 2016, Proceedings, Part I. Volume 9851 of Lecture Notes in Computer Science, pages 777-794, Springer, 2016. [doi]

Abstract

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